المستخلص: |
The study of X-ray diffraction (XRD) and optical properties of Fluorine doped Tin Oxide (FTO) revealed that the layers have a polycrystalline tetragonal structure with a band gap energy of 3.79 eV. The layers have high electrical conductivity with a low sheet resistance equal to 7 Ω/□. The SEM studies indicate the formation of large grains of 100 to 500 nm. Cadmium sulphide (CdS) layers were deposited on FTO using the chemical bath deposition technique under given conditions and characterised using XRD, optical absorption, SEM and PEC measurements. According to x-ray diffraction analysis, the CdS was identified as having a cubic structure. The band gap energy of the as-deposited layer was 2.45 eV and 2.23 eV for the annealed layer, accompanied by a change in colour from yellow to orange. The thickness of the layers was ~ 100 nm. The heat treatment improved the crystallinity of layers. The grain sizes of CBD-CdS layers were ~13 nm for both as deposited and heat treated layer.
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