المصدر: | مجلة التربوي |
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الناشر: | جامعة المرقب - كلية التربية بالخمس |
المؤلف الرئيسي: | Saleh, Ibrahim A. (Author) |
مؤلفين آخرين: | Tarek, M. Fayez (Co-Author) , Ahmed, Mustafah M. A. (Co-Author) |
المجلد/العدد: | ع19 |
محكمة: | نعم |
الدولة: |
ليبيا |
التاريخ الميلادي: |
2021
|
الشهر: | يوليو |
الصفحات: | 398 - 409 |
ISSN: |
2011-421X |
رقم MD: | 1166285 |
نوع المحتوى: | بحوث ومقالات |
اللغة: | الإنجليزية |
قواعد المعلومات: | EduSearch |
مواضيع: | |
كلمات المؤلف المفتاحية: |
Nano-Multilayers "NMLs" | A-Si:H/A-Ge: H | Structure | Electrical Conductivity | Crystallization | Avrami's Equation
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رابط المحتوى: |
المستخلص: |
Nano-multilayers (NMLs) of a-Si:H/a-Ge: H were prepared at 200◦C by alternating deposition from SiH4 and GeH4 plasmas in a computer-controlled four chamber glow-discharge deposition system with capacitive coupled diode reactors. IR spectroscopy and scanning electron microscope (SEM) were used to study the structural changes after annealing at 300 and 450oC for 8 h. The annealed multilayers exhibit surface and bulk degradation with formation of bumps and craters. The electrical measurements results reveal that the increase of electrical conductivity, while optical energy gap is decreased with increasing the annealing temperature and/or time is partially due to formation of H bubbles in the Ge layers and partially due to crystallization effects. On the other hand it was found that the activation energy of crystallization deduced from the annealing time dependence of the conductivity using Avrami's equation is structural dependent. |
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ISSN: |
2011-421X |